FEI Titan Abberation Corrected TEM

Basic Information
Manufacturer: 
FEI
Name/Model #: 
Titan
Type: 
Transmission electron microscope
Location Information
Room #: 
112
Contact Information
Contact Name: 
Alexander Kvit
Phone number: 
608-265-4458
Advanced Information
Features & Accessories: 
This instrument is configured with a CEOS probe-side aberration corrector, which provides revolutionary performance in STEM imaging and microanalysis.
 
CAPABILITY
Imaging single atoms, and nanoscale Chemical and Structure analysis. With <0.08 nm spatial resolution Zcontrast STEM imaging, 0.24 nm point- to- point spatial resolution HRTEM imaging and <0.1 nm information limit. It is fully equipped for analytical analysis with EDS and electron energy loss spectrometers.
 
IMPACT
Applications range from determining interface structures with sub-Ångstrom resolution and chemistry with single-atom precision to imaging various nanostructures.
 
GROWTH
The instrument was commissioned in February 2010 and has about 20 research groups using it, including remote access from Puerto Rico Universities. Two industrial customers and 2 Midwest Universities are also regular users.