Hitachi S-3200N

Basic Information
Manufacturer: 
Hitachi
Name/Model #: 
S-3200N
Type: 
Scanning electron microscope
Location Information
Contact Information
Contact Name: 
Fikrullah Kisa, DVM
Phone number: 
608-263-4162
Advanced Information
Features & Accessories: 
  • Everhart-Thornley secondary electron detector
  • Robinson backscattered electron detector
  • Oxford energy dispersive X-ray spectrometer
  • GW Specimen current meter
  • GW ChamberScope
     
  • Digital imaging of secondary electron images (topographical contrast)
  • Digital imaging of backscattered electron images (atomic number contrast)
  • Digital collection of X-ray spectra
  • Digital X-ray mapping
  • Digital imaging of specimen current
  • EBIC (assumes a means of electrically connecting to the sample!)
  • 5.5 nm @ 30kV in variable pressure mode using the backscattered electron detector
Manufacturer: