Skip to main content
Search form
Search
Home
All Instruments
Facilities
Research facilities
Service facilities
Event Calendar
Education
Graduate courses
Undergraduate courses
Special Seminars
Symposia
Workshops
Contact Us
Other Resources
Intro to Microscopy
Log In
Siemens STOE
X-ray diffraction
Basic Information
Manufacturer:
Siemens AG
Type:
X-ray diffractometer
Location Information
Location:
Materials Science Center
Room #:
840
Fees:
Rate sheet
Scheduling:
Calendar
Contact Information
Contact Name:
Donald Savage
Contact E-mail:
dsavage@facstaff.wisc.edu
Phone number:
608-263-0831
Advanced Information
Features & Accessories:
Standard Bragg-Brentano goniometer and a focussed beam Transmission goniometer
Multiple stages to accommodate many specimen types
Parallel optics attachment for grazing incidence studies of thin films
High temperature furnaces for phase transition studies
Position sensitive detector (PSD) for rapid parallel data collection
Monochromators to eliminate fluorescence artifacts
PC computer controlled
See Also:
Materials Science Center's instruments page
Manufacturer:
Siemens AG